Institut Charles Sadron Equipements
Caracterisation
Sclerometer (instrumented scratch test apparatus)
This instrument named MVS (Micro-Visio-Scratch), developed in the laboratory, is dedicated to the measurement of mechani
Microscopy
Numerical microscope Keyence
Optical microscope (Keyence VHX-5000) with with numerical focus, which allows to (1) obtain images which are focussed ov
| Nom | Emplacement | Catégorie | Equipe | Responsable |
|---|---|---|---|---|
| Optical Tweezers | F142 | Microscopie | MCUBE | Stocco Antonio |
| Confocal Microscopy | F142 | Microscopie | MCUBE | Muller Pierre |
| RICM - Interference microscopy | F146 | Microscopie | MCUBE | Muller Pierre |
| Numerical microscope Keyence | B255 | Microscopie | INCA | Drenckhan Wiebke |
| ELMO glow discharge system | G114 | Microscopie | PLAMICS | Schmutz Marc |
| Edwards Auto 306 Evaporator | G114 | Microscopie | PLAMICS | Schmutz Marc |
| Polarized Light Microscope | G112 | Microscopie | PLAMICS | Carvalho Alain |
| Ion Milling System IM4000Plus | C129 | Microscopie | PLAMICS | Carvalho Alain |
| Scanning Electron Microscope | F134 | Microscopie | PLAMICS | Carvalho Alain |
| Cryo-SEM Preparation System | F134 | Microscopie | PLAMICS | Carvalho Alain |
| Sputter coater | G114 | Microscopie | PLAMICS | Carvalho Alain |
| Transmission electron microscope | G108 | Microscopie | PLAMICS | Schmutz Marc |
| cryologies holder | G108 | Microscopie | PLAMICS | Schmutz Marc |
| heating holder | G108 | Microscopie | PLAMICS | Schmutz Marc |
| Cryo fracture device | G114 | Microscopie | PLAMICS | Schmutz Marc |
| Carbon coater under primary vacuum | G114 | Microscopie | PLAMICS | Schmutz Marc |
| Freezing machine | G118 | Microscopie | PLAMICS | Schmutz Marc |
| Atomic Force Microscopy (AFM) | H0-30 | Microscopie | PLAMICS | Contal Christophe |