This Pendant Drop Tensiometre (TRACKER from TECLIS) analyses in a fully automatic manner the shape of pending/rising bub
The IM4000Plus Ion Milling System utilizes a broad, low-energy Ar+ ion beam milling method to produce wider, undistorted
Nom | Emplacement | Catégorie | Equipe | Responsable |
---|---|---|---|---|
Optical Tweezers | F142 | Microscopie | MCUBE | Stocco Antonio |
Confocal Microscopy | F142 | Microscopie | MCUBE | Muller Pierre |
RICM - Interference microscopy | F146 | Microscopie | MCUBE | Muller Pierre |
Numerical microscope Keyence | B255 | Microscopie | MIM | Drenckhan Wiebke |
ELMO glow discharge system | G114 | Microscopie | PLAMICS | Schmutz Marc |
Edwards Auto 306 Evaporator | G114 | Microscopie | PLAMICS | Schmutz Marc |
Polarized Light Microscope | G112 | Microscopie | PLAMICS | Carvalho Alain |
Ion Milling System IM4000Plus | G114 | Microscopie | PLAMICS | Carvalho Alain |
Scanning Electron Microscope | F134 | Microscopie | PLAMICS | Carvalho Alain |
Cryo-SEM Preparation System | F134 | Microscopie | PLAMICS | Carvalho Alain |
Sputter coater | G114 | Microscopie | PLAMICS | Carvalho Alain |