Institut Charles Sadron Equipements


Caracterisation

Differential refractometer

This differential refractometer is used to measure specific refractive index increments (dn/dc) off-line.


Fabrication

Numerical micromill

This micro-mill is used to mill numerically programmed designs using mills of diamtres between 25 - 2000 microns. It has


Microscopy

Sputter coater

Sputter coater for SEM sample preparation (Au)


Nom Emplacement Catégorie Equipe Responsable
Optical Tweezers F142 MicroscopieMCUBEStocco Antonio
Confocal Microscopy F142 MicroscopieMCUBEMuller Pierre
RICM - Interference microscopy F146 MicroscopieMCUBEMuller Pierre
Numerical microscope Keyence B255 MicroscopieINCADrenckhan Wiebke
ELMO glow discharge system G114 MicroscopiePLAMICSSchmutz Marc
Edwards Auto 306 Evaporator G114 MicroscopiePLAMICSSchmutz Marc
Polarized Light Microscope G112 MicroscopiePLAMICSCarvalho Alain
Ion Milling System IM4000Plus C129 MicroscopiePLAMICSCarvalho Alain
Scanning Electron Microscope F134 MicroscopiePLAMICSCarvalho Alain
Cryo-SEM Preparation System F134 MicroscopiePLAMICSCarvalho Alain
Sputter coater G114 MicroscopiePLAMICSCarvalho Alain
Transmission electron microscope G108 MicroscopiePLAMICSSchmutz Marc
cryologies holder G108 MicroscopiePLAMICSSchmutz Marc
heating holder G108 MicroscopiePLAMICSSchmutz Marc
Cryo fracture device G114 MicroscopiePLAMICSSchmutz Marc
Carbon coater under primary vacuum G114 MicroscopiePLAMICSSchmutz Marc
Freezing machine G118 MicroscopiePLAMICSSchmutz Marc