Institut Charles Sadron Equipements


Caracterisation

4 Probes- Resistivity and Seebeck  measurements

A Keithley 2634B sourcemeter and a Lab Assistant Semiprobe station are used for the 4-point probes resistivity and Seebe


Nom Emplacement Catégorie Equipe Responsable
Optical Tweezers F142 MicroscopieMCUBEStocco Antonio
Confocal Microscopy F142 MicroscopieMCUBEMuller Pierre
RICM - Interference microscopy F146 MicroscopieMCUBEMuller Pierre
Numerical microscope Keyence B255 MicroscopieINCADrenckhan Wiebke
ELMO glow discharge system G114 MicroscopiePLAMICSSchmutz Marc
Edwards Auto 306 Evaporator G114 MicroscopiePLAMICSSchmutz Marc
Polarized Light Microscope G112 MicroscopiePLAMICSCarvalho Alain
Ion Milling System IM4000Plus C129 MicroscopiePLAMICSCarvalho Alain
Scanning Electron Microscope F134 MicroscopiePLAMICSCarvalho Alain
Cryo-SEM Preparation System F134 MicroscopiePLAMICSCarvalho Alain
Sputter coater G114 MicroscopiePLAMICSCarvalho Alain
Transmission electron microscope G108 MicroscopiePLAMICSSchmutz Marc
cryologies holder G108 MicroscopiePLAMICSSchmutz Marc
heating holder G108 MicroscopiePLAMICSSchmutz Marc
Cryo fracture device G114 MicroscopiePLAMICSSchmutz Marc
Carbon coater under primary vacuum G114 MicroscopiePLAMICSSchmutz Marc
Freezing machine G118 MicroscopiePLAMICSSchmutz Marc
Atomic Force Microscopy (AFM) H0-30 MicroscopiePLAMICSContal Christophe