Institut Charles Sadron Equipements
Caracterisation
Sclerometer (instrumented scratch test apparatus)
This instrument named MVS (Micro-Visio-Scratch), developed in the laboratory, is dedicated to the measurement of mechani
Microscopy
Optical Tweezers
Modular Optical Tweezers provide users with a tool for trapping and manipulating microscopic-sized objects. These laser-
| Nom | Emplacement | Catégorie | Equipe | Responsable |
|---|---|---|---|---|
| Ellipsometry | F136 | Caractérisation | MCUBE | Stocco Antonio |
| Optical Tweezers | F142 | Microscopie | MCUBE | Stocco Antonio |
| F246 | Caractérisation | PECMAT | Pauly Matthias | |
| Confocal Microscopy | F142 | Microscopie | MCUBE | Muller Pierre |
| Isothermal titration calorimetry | C125 | Caractérisation | MCUBE | Schmatko Tatiana |
| Electroporation | F146 | Caractérisation | MCUBE | Muller Pierre |
| RICM - Interference microscopy | F146 | Microscopie | MCUBE | Muller Pierre |
| A337 | Caractérisation | PECMAT | Boulmedais Fouzia | |
| A335 | Caractérisation | PECMAT | Boulmedais Fouzia | |
| A335 | Caractérisation | PECMAT | Boulmedais Fouzia | |
| A339 | Fabrication | PECMAT | Boulmedais Fouzia | |
| A339 | Fabrication | PECMAT | Boulmedais Fouzia | |
| A339 | Caractérisation | PECMAT | Boulmedais Fouzia | |
| Static and dynamic light scattering | F136 | Caractérisation | CarMac | Schosseler François |
| Numerical microscope Keyence | B255 | Microscopie | INCA | Drenckhan Wiebke |
| Glove box | G116 | Fabrication | SYCOMMOR | Brinkmann Martin |
| 4 Probes- Resistivity and Seebeck measurements | G116 | Caractérisation | SYCOMMOR | Brinkmann Martin |
| Rubbing machine | G120 | Fabrication | SYCOMMOR | Brinkmann Martin |
| Discover SP - Microwave reactor | D307 | Fabrication | SYCOMMOR | Ruiz Carretero Amparo |
| TGA | E349 | Caractérisation | CarMac | Legros Mélanie |
| DSC | E344 | Caractérisation | CarMac | Saettel Herr Catherine |
| Spectrofluorometer | E348 | Caractérisation | CarMac | De Maria Anaïs |
| UV-Vis-NIR spectrophotometer Lambda 25 | E348 | Caractérisation | CarMac | De Maria Anaïs |
| UV-Vis-NIR Spectrophotometer Cary 5000 | E348 | Caractérisation | CarMac | De Maria Anaïs |
| Dynamic light scattering and zeta potential | E348 | Caractérisation | CarMac | Legros Mélanie |
| Capillary Viscosimeter | E348 | Caractérisation | CarMac | Foussat Catherine |
| Differential refractometer | E346 | Caractérisation | CarMac | Legros Mélanie |
| ELMO glow discharge system | G114 | Microscopie | PLAMICS | Schmutz Marc |
| Edwards Auto 306 Evaporator | G114 | Microscopie | PLAMICS | Schmutz Marc |
| SEC in THF n°1 | E346 | Caractérisation | CarMac | De Maria Anaïs |
| SEC in THF n°2 | E346 | Caractérisation | CarMac | De Maria Anaïs |
| SEC in organic solvent | E346 | Caractérisation | CarMac | Foussat Catherine |
| SEC in polar organic solvents | E348 | Caractérisation | CarMac | Foussat Catherine |
| SEC in aqueous solvent n°1 | E346 | Caractérisation | CarMac | Foussat Catherine |
| SEC in aqueous solvent n°2 | E346 | Caractérisation | CarMac | Legros Mélanie |
| Bruker Vertex 70 Infrared spectrophotometer | E350 | Caractérisation | CarMac | De Maria Anaïs |
| Thin Film Pressure Balance | F046 | Caractérisation | INCA | Drenckhan Wiebke |
| Numerical micromill | F050 | Fabrication | INCA | Drenckhan Wiebke |
| Foam analyser (FOAMSCAN) | A159 | Caractérisation | INCA | Drenckhan Wiebke |
| Sclerometer (instrumented scratch test apparatus) | G004 | Caractérisation | Minamec | Favier Damien |
| Tensile machine | G006 | Caractérisation | Minamec | Favier Damien |
| Dynamic tensile machine | G008 | Fabrication | Minamec | Favier Damien |
| NanoIndenter - NanoScratch | G001 | Caractérisation | Minamec | Favier Damien |
| Tribometer | G008 | Caractérisation | Minamec | Favier Damien |
| Micro Tribometer | F144 | Caractérisation | MIM | Favier Damien |
| Dynamic JKR | G004 | Caractérisation | Minamec | Favier Damien |
| X-ray CT scanner | G014 | Caractérisation | Minamec | Egele Antoine |
| Polarized Light Microscope | G112 | Microscopie | PLAMICS | Carvalho Alain |
| Pendant drop tensiometre (TRACKER TECLIS) | B255 | Caractérisation | INCA | Jacomine Leandro |
| Rheometre | A159 | Caractérisation | INCA | Jacomine Leandro |
| Tensiomètre (type Wilhelmy) | B255 | Caractérisation | INCA | Jacomine Leandro |
| Foam analyser (FOAMSCAN TECLIS) | A159 | Caractérisation | INCA | Drenckhan Wiebke |
| "Double bubble" experiment | B255 | Caractérisation | MIM | Jacomine Leandro |
| Ion Milling System IM4000Plus | C129 | Microscopie | PLAMICS | Carvalho Alain |
| Scanning Electron Microscope | F134 | Microscopie | PLAMICS | Carvalho Alain |
| Cryo-SEM Preparation System | F134 | Microscopie | PLAMICS | Carvalho Alain |
| Sputter coater | G114 | Microscopie | PLAMICS | Carvalho Alain |
| DMA Mettler Toledo | G008 | Caractérisation | Minamec | Favier Damien |
| ARES Rheometer | G008 | Caractérisation | Matte'Rheo | Vahdati Mehdi |
| HAAKE MARS III Rheometer | C129 | Caractérisation | Matte'Rheo | Vahdati Mehdi |
| Transmission electron microscope | G108 | Microscopie | PLAMICS | Schmutz Marc |
| cryologies holder | G108 | Microscopie | PLAMICS | Schmutz Marc |
| heating holder | G108 | Microscopie | PLAMICS | Schmutz Marc |
| Cryo fracture device | G114 | Microscopie | PLAMICS | Schmutz Marc |
| Carbon coater under primary vacuum | G114 | Microscopie | PLAMICS | Schmutz Marc |
| Freezing machine | G118 | Microscopie | PLAMICS | Schmutz Marc |
| Atomic Force Microscopy (AFM) | H0-30 | Microscopie | PLAMICS | Contal Christophe |